کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5488781 | 1399584 | 2017 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Investigation on I-V characteristics of current induced metal insulator transition in VO2 device
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The I-V characteristics of two terminal planar VO2 film devices are investigated as the devices undergo the current induced metal insulator transition (I-MIT). The I-MIT occured when the device resistivity reached â¼7 Ωcm, where metallic grains formed initial conductive current path within insulating matrix. The transition time needed for the I-MIT increased with increasing external resistance, REXT, connected to the device in series, i.e. â¼390 μs (REXT = 5 kΩ) to â¼1400 μs (REXT = 20 kΩ). The transition time is closely related to the RC time delay from capacitance discharge of the VO2 device. During the I-MIT, the amount of discharge current was estimated as large as â¼100 mA, which was larger than the current just before the I-MIT. After the I-MIT, the current density decreased from 1.1 Ã 106 A/cm2 to 6.5 Ã 105 A/cm2, suggesting a large temperature changes up to â¼300 °C.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 17, Issue 11, November 2017, Pages 1444-1449
Journal: Current Applied Physics - Volume 17, Issue 11, November 2017, Pages 1444-1449
نویسندگان
Gi Yong Lee, Howon Kim, Bongjin Simon Mun, Changwoo Park, Honglyoul Ju,