کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5488810 1399585 2017 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Non-piezoelectric effects in piezoresponse force microscopy
ترجمه فارسی عنوان
اثرات غیر پیزوالکتریک در میکروسکوپ نیروی پیزورسپس
کلمات کلیدی
میکروسکوپ نیروی پی یوزسپس، پاسخ الکترومکانیکی، اثر پیزوالکتریک، اثر الکترواستاتیک، الکتروشیمیایی،
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
چکیده انگلیسی
Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 17, Issue 5, May 2017, Pages 661-674
نویسندگان
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