کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
549020 | 1450549 | 2013 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Approach of a physically based lifetime model for solder layers in power modules
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
• A physic-based approach for life-time estimation in power cycling tests is presented.
• The presented approach is supported by numerical simulations.
• The simulation data is updated in each crack propagation step.
For the calculation of the lifetime of power modules only empirical lifetime models are available. These models represent a best-fit of a large number of results from power cycling tests, and are not derived from a physical model. In this paper a physic-based approach will be presented. Crack propagation in a solder layer, the increase of the thermal resistance and therewith the expected lifetime is calculated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 53, Issues 9–11, September–November 2013, Pages 1199–1202
Journal: Microelectronics Reliability - Volume 53, Issues 9–11, September–November 2013, Pages 1199–1202
نویسندگان
P. Steinhorst, T. Poller, J. Lutz,