Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project

• A new research activity which mixes EMC and IC reliability.
• We study the effect of IC aging its electromagnetic behavior.
• Experimental methodology to qualify IC EMC drifts after aging.
• Link between on-chip degradation mechanisms and EMC drifts.
• Methodology to predict long-term electromagnetic robustness.

This paper presents the scientific achievements of EMRIC project that aimed at developing a new research activity which mixes EMC and IC reliability. This project contributes to improve the electromagnetic robustness (EMR) of integrated circuits over the full life-time of the electronic system, with a special emphasis on deep submicron technology. The results of this project give a unique overview about EMR in the scientific community and will contribute to develop EMR qualification procedures, EMR design techniques and EMR predictive methods.