SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up

• The scaling to smaller technologies make circuits more radiation sensitive.
• A range between 10% and 40% of the whole faults may turn into permanent.
• Computer-aided design together with layout information depict circuit sensitivity.
• Validation through high temperature radiation test experiments.

Space missions require extremely high reliable components that must guarantee correct functionality without incurring in catastrophic effects. When electronic devices are adopted in space applications, radiation hardened technology should be mandatorily adopted. In this paper we propose a novel method for analyzing the sensitivity with respect to Single Event Latch-up (SEL) in radiation hardened technology. Experimental results obtained comparing heavy-ion beam campaign demonstrated the feasibility of the proposed solution.