Frequency mapping in dynamic light emission with wavelet transform

• Frequency of emission is automatically determined.
• It is based on a combination of CWT and autocorrelation.
• Test structure is a FPGA in which 3 inverter chains are implemented.
• Three different frequency sets are used for stimulation.
• Maximum detection rates are 97% et 100 % for design01/03. A most 65% on design02.

Dynamic photon emission microscopy is an efficient tool to analyse today’s integrated circuit. Nevertheless, the reduction of transistor’s dimensions leads to more complex acquisitions where many spots can be seen. A frequency characterization of the whole acquired area can help to have a better understanding of it. With that purpose in mind, a new methodology to draw frequency mapping of dynamic light emission acquisition is reported. It is fully automated and based on wavelet transform and autocorrelation function. Regarding the possible use in an industrial context, the suggested method can help to localize abnormal emission activity and it gives some perspectives on automatic databases comparison.