ESD characterization of a 190V LIGBT SOI ESD power clamp structure for plasma display panel applications

In this paper, ESD protection devices for power rails in a PDP scan IC are studied. By numerical simulation, current flow distribution of LIGBT under ESD stress is analyzed. The proposed latchup free LIGBT has additional discharge mechanism to optimize the discharge path, and much smaller discharge resistance can be obtained. As demonstrated by TLP test, optimized LIGBT has 33% larger It2 than HV diode, and its Vt2 is only 27 V higher than its breakdown voltage.