Shock impact reliability characterization of a handheld product in accelerated tests and use environment

The effect of mechanical shock impacts is a key factor in the reliability of modern handheld products. Due to differences in product enclosures, impact orientations, strike surfaces and mountings of component boards, the loading conditions induced in a true product drop differ from those encountered in standardized board-level tests. In order to better understand the correlation between board-level drop testing and actual drops of a complete device, series of board and product-level drop tests were conducted using specialized test boards.The mechanical shock impact response of the commercial handheld device component board was characterized with the help of acoustic excitation laser vibrometry and finite element analysis. The results were used to design the mechanically compatible specialized test board for both 4-point supported board-level and unsupported product-level drop tests. Special care was taken to ensure that the vibration behavior of the test board accurately represented the vibration behavior of the commercial component board. Additional board-level drop tests were conducted using a JEDEC JESD22-B111 compliant component board for comparison.The drop test results showed that, even though the test board design and supporting method have a marked influence on the strain conditions and lifetime of solder interconnections, the primary failure mode and mechanism under the product-level drop tests is comparable to that typically encountered in the standard JEDEC JESD22-B111 board-level drop tests. More detailed analyses suggest that the comparability of the shock impact loading conditions affecting solder interconnections can be characterized using three metrics: (1) the maximum component board strain rate, (2) the maximum board strain amplitude and (3) the damping of the component board.

► Board- and product-level drop tests of a handheld device are compared.
► Loading conditions, failure mechanisms and lifetimes are investigated.
► Strain rate, magnitude and mechanical damping are defined as critical parameters.
► Failure mechanisms are found to be same in product- and board level tests.
► Board-level test can be used to estimate product-level test performance.