Functional delay test generation based on software prototype

The paper presents two methods of functional delay test development based on the software prototype as well as the results of their application to benchmark circuits. The first method is used to construct the functional delay test on the base of a pin pair test generated at the functional level for detection of stuck-at faults at the gate-level. The constructed test is a single input transition test. The latter appears to be quite large. Therefore, we provide the method for compacting it. The compacted single input transition test becomes a multi-input transition test. The second method is used to generate a multi-input transition test. The generated functional test pattern pairs possess function-robust and/or function-non-robust properties. The introduction of the function-non-robust property enriches the functional delay test. The presented test construction approach based on the software prototype allows obtaining a functional delay test, which detects the transition faults at the gate-level of a circuit quite completely.