کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
549681 872399 2009 13 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Underfill selection methodology for fine pitch Cu/low-k FCBGA packages
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Underfill selection methodology for fine pitch Cu/low-k FCBGA packages
چکیده انگلیسی

A systematic underfill selection approach has been presented to characterize and identify suitable underfill encapsulants for large size flip chip ball grid array (FCBGA) packages. In the selection scheme, a total of six evaluation factors such as fracture toughness, coefficient of moisture expansion, flowability, delamination performance and filler settlement were considered. Driving stresses for package failure were also included as a factor of consideration, which clearly depends on the package size and geometry. Based on the approach adopted, underfill material that is suitable for 35 × 35 mm2 packages with 15 mm die size and 45 × 45 mm2 packages with 21 mm die size was selected. Target value for underfill properties has also been revised.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 49, Issue 2, February 2009, Pages 150–162
نویسندگان
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