Phase Content of Interfaces Ti/Al3Ti in Metal-intermetallic Laminate Studied by x-ray and Synchrotron Diffraction

The present investigation focuses on the phase content of micron composite layers studied by x-ray and synchrotron diffraction. The Ti-Al3Ti composite has been produced by reaction sintering of titanium and aluminum foils under pressure. Sintering was finished when Al layer was fully consumed to form an intermetallic Al3Ti. X-ray diffraction (Bragg-Brentano geometry with a flat-plate sample) showed that composite layers basically contain only Ti and Al3Ti phases. Synchrotron diffraction allowed to reveal the presence of residuals of Al phase. Diffraction experiments were performed at the SR beamline №4 of the VEPP-3 storage ring. The frame capture mode with the use of the synchrotron beam, 0.4×0.1 mm, allowed proving the absence of Al2O3 phase particles along the Ti/Al3Ti interfaces.