کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
552509 1451085 2014 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Elliptic curve-based RFID/NFC authentication with temperature sensor input for relay attacks
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سیستم های اطلاعاتی
پیش نمایش صفحه اول مقاله
Elliptic curve-based RFID/NFC authentication with temperature sensor input for relay attacks
چکیده انگلیسی


• We use ambient conditions (here, temperature) for relay attacks.
• Elliptic-curve based public key cryptography for mutual authentication
• Address replay attacks based on tag temperature and signal round-trip time

Unless specifically designed for its prevention, none of the existing RFID authentication protocols are immune to relay attacks. Relay attacks generally involve the presence of one or more adversaries who transfer unmodified messages between a prover and a verifier. Given that the message content is not modified, it is rather difficult to address relay attacks through cryptographic means. Extant attempts to prevent relay attacks involve measuring signal strength, round-trip distance, and ambient conditions in the vicinity of prover and verifier. While a majority of related authentication protocols are based on measuring the round-trip distance between prover and verifier using several single-bit challenge–response pairs, recent discussions include physical proximity verification using ambient conditions to address relay attacks. We provide an overview of existing literature on addressing relay attacks through ambient condition measurements. We then propose an elliptic curve-based mutual authentication protocol that addresses relay attacks based on (a) the surface temperature of the prover as measured by prover and verifier and (b) measured single-bit round-trip times between prover and verifier. We also evaluate the security properties of the proposed authentication protocol.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Decision Support Systems - Volume 59, March 2014, Pages 28–36
نویسندگان
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