کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
603189 880182 2008 13 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Thin liquid films studied by atomic force microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی شیمی کلوئیدی و سطحی
پیش نمایش صفحه اول مقاله
Thin liquid films studied by atomic force microscopy
چکیده انگلیسی

Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investigating thin liquid films. In this paper we review experimental work on confined Newtonian and non-Newtonian liquids using the AFM.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Opinion in Colloid & Interface Science - Volume 13, Issue 3, June 2008, Pages 107–119
نویسندگان
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