کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
603274 880201 2014 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Synchrotron X-ray techniques for the investigation of structures and dynamics in interfacial systems
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی شیمی کلوئیدی و سطحی
پیش نمایش صفحه اول مقاله
Synchrotron X-ray techniques for the investigation of structures and dynamics in interfacial systems
چکیده انگلیسی


• This is a review of recent results obtained in the last years by synchrotron radiation.
• Techniques: reflectivity (XRR) grazing incidence diffraction (GIXRD) fluorescence (GIXF) photon correlation (XPCS, GI-XPCS)
• Systems: floating Langmuir monolayers, supported films, gels and colloids either in 3D or as 2D interfacial layers

This review focuses on recent results obtained by synchrotron X-ray techniques applied to the characterization of interfacial systems, with main emphasis on flat interfaces and on colloidal systems. The techniques covered are, for structural determinations: X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GIXRD) and grazing incidence X-ray excited fluorescence (GIXF), while dynamics are investigated by X-ray photon correlation spectroscopy (XPCS) mainly in the grazing-incidence geometry (GIXPCS).The systems reviewed are, in order of growing complexity, floating Langmuir monolayers, supported films of lipids and proteins, polymeric films, buried interfaces, colloidal systems and gels formed by colloids either in 3D or in the form of 2D interfacial layers. Recent results are critically discussed, and some interesting directions of development are outlined, having also in mind new technical developments such as X-ray free electron laser sources and micro-focused synchrotron beamlines.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Opinion in Colloid & Interface Science - Volume 19, Issue 3, June 2014, Pages 228–241
نویسندگان
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