In situ characterization of the brain-microdevice interface using Device Capture Histology

► We demonstrate how current histological methods for examining CNS implanted devices are lacking. ► We describe a method to consistently capture CNS microdevices within an intact tissue section. ► A protocol and discussion on labeling and imaging these thicker tissue slices are presented. ► Microscopy data from along the length of in situ CNS microdevices are shown and quantified. ► Results include multi-nucleated responses at device interfaces, and myelin reorganization.