کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6946465 | 1450545 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Improvement of MOSFET matching characterization with calibrated multiplexed test structure
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
This paper presents a way to implement a test structure able to measure accurately a large number of threshold voltage values for Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) matching characterization. A multiplexed system able to select a single transistor among others in a small array is used. This architecture guarantees a similar environment for all transistors in the array, while requiring a small number of pads for measurement. Moreover, the influence of the multiplexer switches can be evaluated: their unwanted contribution to the measurement can therefore be compensated. An experimental study to evaluate the influence of this multiplexer on measurement and the efficiency of the compensation is conducted. Silicon results are presented in order to validate the concept.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 55, Issues 9â10, AugustâSeptember 2015, Pages 1328-1333
Journal: Microelectronics Reliability - Volume 55, Issues 9â10, AugustâSeptember 2015, Pages 1328-1333
نویسندگان
L. Welter, J.L. Scotto di Quaquero, P. Dreux, L. Lopez, H. Aziza, J.M. Portal,