کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6946515 | 1450545 | 2015 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification](/preview/png/6946515.png)
چکیده انگلیسی
The primary phase of electronic prognostic uncertainty quantification included the identification and quantification of uncertainty sources through utilizing sensitivity analysis method. An improved EFAST-based sensitivity analysis method that considered the possibility of parameter fluctuation was used to identify the key factors (KFS) of uncertainty sources. Also, an envelope probability method was adopted to further quantify the key factors of parameter distribution. Finally, a board-level electronic product was chosen as the study case of this paper. Comparing the result of uncertainty quantification, sensitivity analysis was used to drive the result of the single-dimensional method. It was obvious that the sensitivity analysis method used in this paper has optimized the input parameters of the model and improved the accuracy of electronic prognostic uncertainty quantification.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 55, Issues 9â10, AugustâSeptember 2015, Pages 1384-1390
Journal: Microelectronics Reliability - Volume 55, Issues 9â10, AugustâSeptember 2015, Pages 1384-1390
نویسندگان
Bo Sun, Wuyang Pan, Zili Wang, Kam-Chuen Yung,