کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
6946677 1450545 2015 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization
چکیده انگلیسی
This paper will detail the possibilities given by the magnetic imaging to observe this kind of defect in conditions where the basic use would normally be unable to, since a capacitive and/or an inductive device would blind it. A test vehicle has been realized in order to evaluate this new use of the magnetic imaging. Finally, a piezo-actuator component is then studied in order to prove the concept.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 55, Issues 9–10, August–September 2015, Pages 1622-1627
نویسندگان
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