Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980Â nm high-power laser diodes

- We observe atypical laser diode (LD) signatures in reverse I-V measurement identified as microplasma discharges.
- Correlation between reverse I-V signatures and LFN measurements appears as a complementary tool for improvement of screening methodology for LD.
- Reverse and forward noise spectra especially exhibit 1/f noise.
- Some lasers reveal g-r noise component in bias voltages corresponding to reverse I-V slope changes and around ITH.
- Presence of g-r noise leads to believe that point defect can be localized near the active zone.