کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
6946905 1450547 2014 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package
چکیده انگلیسی
Localizing defects (particularly, dead open and resistive open defects) at package level is becoming a critical challenge for Failure Analysis Laboratories due to package miniaturisation and increased complexity. One of the well-known approaches to address this set of problems within a Device Under Test (DUT) is Time Domain Reflectometry (TDR). The main limitation of this technique is the lack of distance-to-defect accuracy and sensitivity. Electro Optical Terahertz Pulse Reflectometry (EOTPR) overcomes these limitations by using photoconductive terahertz generation and detection technology, resulting in a system with: (i) high measurement bandwidth, (ii) extremely low time base jitter, and (iii) high time base accuracy and range with greater sensitivity. In this paper we present case studies in which EOTPR has been successfully applied to a series of different device types.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 54, Issues 9–10, September–October 2014, Pages 2075-2080
نویسندگان
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