کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6946905 | 1450547 | 2014 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
Localizing defects (particularly, dead open and resistive open defects) at package level is becoming a critical challenge for Failure Analysis Laboratories due to package miniaturisation and increased complexity. One of the well-known approaches to address this set of problems within a Device Under Test (DUT) is Time Domain Reflectometry (TDR). The main limitation of this technique is the lack of distance-to-defect accuracy and sensitivity. Electro Optical Terahertz Pulse Reflectometry (EOTPR) overcomes these limitations by using photoconductive terahertz generation and detection technology, resulting in a system with: (i) high measurement bandwidth, (ii) extremely low time base jitter, and (iii) high time base accuracy and range with greater sensitivity. In this paper we present case studies in which EOTPR has been successfully applied to a series of different device types.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 54, Issues 9â10, SeptemberâOctober 2014, Pages 2075-2080
Journal: Microelectronics Reliability - Volume 54, Issues 9â10, SeptemberâOctober 2014, Pages 2075-2080
نویسندگان
A. Reverdy, M. Marchetti, A. Fudoli, A. Pagani, V. Goubier, M. Cason, J. Alton, M. Igarashi, G. Gibbons,