Statistical model of NBTI and reliability simulation for analogue circuits

The faults caused by process variation and degradation are different, which makes it difficult to handle reliability. This paper proposes a statistical model of NBTI, which captures all the variations that come from circuit use conditions, and presents a framework to do analogue reliability simulations, with which reliability can be handled as early as the design phase. A feed-forward equalizer (FFE) was studied. For this circuit, we have found the limiting performances for reliability, which helps to enable the design of on-line tests for reliability.