کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
6947089 1450550 2012 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Through silicon in-circuit logic analysis for localizing logic pattern failures
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Through silicon in-circuit logic analysis for localizing logic pattern failures
چکیده انگلیسی
Laser timing probes are used to display waveforms at single points or frequencies mapped throughout a field of view in an effort to locate logic failures. By focusing just on the logic state itself, this paper describes an approach that quickly determines the logic timing patterns and uses this information to identify logic pattern mismatches on-the-fly at specific locations, such as cells in a scan chain. Various applications and case studies are presented.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 52, Issues 9–10, September–October 2012, Pages 2043-2049
نویسندگان
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