Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory

► The proposed methodology is based on pseudo-Dynamic Photoelectric Laser Stimulation. ► We present a new flow to deal with Latch-Up phenomenon issues. ► For it we developed a manner to trig Latch-Up allowing localization of sources of it. ► This method allowed us localizing a microcontroller's parasitic bipolar transistor.