کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7137068 | 1461883 | 2014 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Adhesion energy of few layer graphene characterized by atomic force microscope
ترجمه فارسی عنوان
انرژی جذب گرافن چند لایه که توسط میکروسکوپ نیروی اتمی مشخص می شود
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
الکتروشیمی
چکیده انگلیسی
This paper presents a generic approach to characterize and analyze the adhesion energy between graphene and different materials using nanoindentation of an atomic force microscope (AFM), which is extremely essential and critical for variety of graphene based micro- and nano-devices. AFM was used to press a free-standing graphene beam down to a substrate. During the retraction, the adhesion force (named as the secondary pull-off force) was measured to analyze the adhesion energy between the graphene beam and the substrate. This approach is easy for manipulation and it can detect the adhesion energy after the device fabrication. According to our measurement, the graphene/SiO2, graphene/gold, and graphene/graphene adhesion energies per area are approximately 270Â mJ/m2, 255Â mJ/m2, and 307Â mJ/m2, respectively. This result was used to predict the performances and guide the design of graphene M/NEMS devices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators A: Physical - Volume 217, 15 September 2014, Pages 56-61
Journal: Sensors and Actuators A: Physical - Volume 217, 15 September 2014, Pages 56-61
نویسندگان
Peng Li, Zheng You, Tianhong Cui,