کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7149324 | 1462117 | 2012 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Polarization interference interrogation of angular surface plasmon resonance sensors with wide metal film thickness tolerance
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We apply the polarization interferometry (PI) technique to a one-dimensional SPR sensor based on angle interrogation, for improving the refractive index (RI) resolution and reducing the dependence of RI resolution on the thickness of metal films. We demonstrate experimentally that the PI technique could reduce the minimum of the SPR angular spectrum, and improve the RI resolution of the sensors with non-optimal metal films, reducing the dependence of the RI resolution on the thickness of metal films. Furthermore, the application of PI technique at the angles, which are smaller than the original angle affording the minimum, could further improve the RI resolution of the system even better than the original optimal condition. RI resolution ranging from 1.2 to 2.2Â ÃÂ 10â7 refractive index unit (RIU) is achieved with the thickness of the Au film ranging from 28.2 to 54.4Â nm. The PI technique has potential applications in producing SPR sensors with high RI resolution and wide metal film thickness tolerance.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators B: Chemical - Volume 173, October 2012, Pages 218-224
Journal: Sensors and Actuators B: Chemical - Volume 173, October 2012, Pages 218-224
نویسندگان
Le Liu, Xiangliang Chen, Zhiyi Liu, Suihua Ma, Chan Du, Yonghong He, Jihua Guo,