Differential algebraic description for aberrations analysis of typical electrostatic einzel lens

In the present paper the modern map method has been used to calculate the third-fifth order geometric aberration, the first-third order chromatic aberration and the Gaussian optical properties for Schiske's and inverse Schiske's electrostatic lenses. COSY INFINITY 10 program is used for the aberration analysis and calculation of properties of electrostatic electron lenses. The Numerical results show that the differential algebraic method is an excellent method with high accuracy for calculating the high order electron optical aberration analysis.