Influence of capacitance characteristic on I–V measurement of dye-sensitized solar cells

The quantitative analysis, which based on equivalent circuits and parameter estimating, approved the capacitance characteristic of DSSCs caused the fluctuation of the measured efficiency. The equivalent circuit parameter was estimated from a typical dye solar cell, which was characterized with the crystalline ingredient, particle size and I–V curve. Quantitative analysis and corresponding formula expression between the capacitance and the measured I–V curve is given, and a proper range of scan speed for accurate measuring the efficiency of DSSC is suggested. It is found the traditional I–V measurement method is limited in the measurement of dye-sensitized solar cells (DSSCs). Experiments showed that, the scan speed in this method influences the measured DSSCs’ efficiency value greatly, while none such impact was found in that of Si cell.

► We quantitatively analyzed DSSC’s capacitance with it’s electrical properties.
► The capacitance characteristic of DSSCs caused the measured efficiency fluctuation.
► The bias voltage scan speed in measurement influences the measured results.
► Our theoretical deduction was well confirmed by experiment results.