کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7278846 | 1473874 | 2014 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Long-term academic stress increases the late component of error processing: An ERP study
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موضوعات مرتبط
علوم زیستی و بیوفناوری
علم عصب شناسی
علوم اعصاب رفتاری
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چکیده انگلیسی
Exposure to long-term stress has a variety of consequences on the brain and cognition. Few studies have examined the influence of long-term stress on event related potential (ERP) indices of error processing. The current study investigated how long-term academic stress modulates the error related negativity (Ne or ERN) and the error positivity (Pe) components of error processing. Forty-one male participants undergoing preparation for a major academic examination and 20 non-exam participants completed a Go-NoGo task while ERP measures were collected. The exam group reported higher perceived stress levels and showed increased Pe amplitude compared with the non-exam group. Participants' rating of the importance of the exam was positively associated with the amplitude of Pe, but these effects were not found for the Ne/ERN. These results suggest that long-term academic stress leads to greater motivational assessment of and higher emotional response to errors.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Biological Psychology - Volume 99, May 2014, Pages 77-82
Journal: Biological Psychology - Volume 99, May 2014, Pages 77-82
نویسندگان
Wu Jianhui, Yuan Yiran, Duan Hongxia, Qin Shaozheng, Tony W. Buchanan, Zhang Kan, Zhang Liang,