کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
728492 | 892839 | 2008 | 13 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Emissivity measurements on electronic microcircuits
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
An analytical comparison of the accuracy of the most often used methods of emissivity measurements carried out during infrared thermographic studies on electronic microcircuits (thin-, thick-film and hybrid ones, high-density miniature PCBs, microsystems) is the main purpose of this paper. A typical measurement arrangement applied to these studies and main factors influencing the measurement results are presented. A special relationship describing the thermographic camera signal has been formulated. Conventional and unconventional methods of the emissivity measurements together with a detailed analysis of the accuracy of typical methods are presented in the paper. A criterion and a procedure of choosing the emissivity measurement method are also proposed. Similar problems concerning the temperature measurements will be presented and discussed in the next paper.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Measurement - Volume 41, Issue 5, June 2008, Pages 503-515
Journal: Measurement - Volume 41, Issue 5, June 2008, Pages 503-515
نویسندگان
Tadeusz Walach,