Defining DAC performance in the frequency domain

DAC metrology standardization is essential to ensure quality, safety, reliability, efficiency and interchangeability for this fundamental electronic device. Therefore, a strong demand for a DAC standard is questioned both from device manufacturers and users not only for defining test methods but also for achieving a consistent terminology so that device specifications can be interpreted properly and misunderstandings avoided. The main purpose of this paper is defining DAC performance in the frequency domain to give contributions and ideas for discussion concerning the new IEEE standard for terminology and test methods for DAC. New definitions for THD, SFDR, SNR, SINAD, ENOB and IMD are proposed taking into account the most used definitions, their measurability and the need of avoiding any ambiguities.