کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
730143 | 892955 | 2011 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Measurement optimum condition of speckle interferometry based on dual-camera technique
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The speckle interferometer based on multi-camera technology using two cameras is applied to a dynamic deformation measurement of the package of an electronic device. To perform high precise measurement by this method, the optimum conditions for measurements are discussed concerning the size of speckle and the frequency of carrier signals. Under the optimum conditions, the deformation process of the package during the operation of an operational amplifier is measured. Then, the local maximum deformation can be estimated as 150 nm from experimental results. From the results, it can be also confirmed that electronic devices are deformed by the stress of a heat by an operation every second during the operating time.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Measurement - Volume 44, Issue 1, January 2011, Pages 29–33
Journal: Measurement - Volume 44, Issue 1, January 2011, Pages 29–33
نویسندگان
Y. Arai, T. Takegawa, S. Yokozeki,