کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
730257 | 1461537 | 2014 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Small-pixel TFT flaw detection and measurement using voltage imaging technique Small-pixel TFT flaw detection and measurement using voltage imaging technique](/preview/png/730257.png)
• A good solution for small-pixel TFT flaw detection.
• A measurement with advantages of in-process and no contact damaged to TFT array panels.
• An inspection provides better small-pixel point flaw detection capability.
• A suitable way to detect a small-pixel defect using voltage imaging technique.
The paper proposed the characteristics of flaw measurement in small-pixel design mobile displays based on TFT array panel with respect to electrical-optic characterization. For advanced small-pixel and high-resolution mobile display applications, the display pixels on array process are smaller, detecting small-pixel defect played an important role than previously seen in non-small-pixel TFT array panels for managing process yield. The study resulted in small-pixel size TFT array show the flaw detection performance and preference approaches using the voltage imaging technique. It provides an initial insight into the high-resolution of small-pixel size designs for advanced mobile displays application.
Journal: Measurement - Volume 50, April 2014, Pages 121–125