Reduced configuration set for the multi-step method applied to machine and probe error separation on a CMM

This paper presents a refinement and further analysis of an application of the multi-step method for the separation of machine and probe errors on a CMM using multiple redundancy probing of the machine’s own master ball. The objective is to reduce the amount of data required and so minimize the test time in order to reduce the industrial cost of such periodic verifications.

► The multi-step method is used for the separation of machine and probe errors on a CMM.
► Four strategies are investigated to reduce the number of test configurations needed.
► The number of test configurations is reduced from 24 to 9 and then down to 3.