کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
731103 893029 2006 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Metrological characteristics of wavelet filter used for engineering surfaces
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
Metrological characteristics of wavelet filter used for engineering surfaces
چکیده انگلیسی

The functional behavior of manufactured surfaces is influenced by the errors such as roughness, waviness and form errors that are present on the surface. A filtering process is used to establish a three-dimensional reference surface consisting of waviness and form errors and the roughness component is separated with reference to it. The metrological characteristics of a filter are better understood in terms of wavelength content and phase information. In this paper, metrological characteristics of wavelet filter suggested for processing of engineering surfaces are discussed. A few typical manufactured surfaces and their reference surfaces established by wavelet filter are further analyzed by random process techniques to bring out the waviness content and phase matching.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Measurement - Volume 39, Issue 7, August 2006, Pages 575–584
نویسندگان
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