کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
731542 893070 2012 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Inter-laboratories comparison at 100 GΩ and 1 TΩ level to evaluate the traceability transfer from INRIM in the field of high dc resistance
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
Inter-laboratories comparison at 100 GΩ and 1 TΩ level to evaluate the traceability transfer from INRIM in the field of high dc resistance
چکیده انگلیسی

A National inter-laboratories comparison of dc resistance at 100 GΩ and 1 TΩ among the National Institute of Metrological Research (INRIM) and eight Secondary Electrical Calibration Laboratories was carried out in 2010. All the involved Laboratories made their measurements with a method based on a Multifunction Calibrator (MFC) and on a digital multimeter (DMM), both used in their dc voltage function.These and other Secondary Electrical Laboratories are traceable to National Standards by means of the calibration at INRIM of a complete set of primary standards or, alternatively, by means of the calibration of a high accuracy DMM or of a Multifunction Transfer Standard (MTS) or of few primary standards. All the relative differences between each Laboratory’s value and its reference value obtained in the comparison were within their relative expanded uncertainties. This result showed that the traceability transfer methods from INRIM to Electrical Secondary Laboratories lead to satisfactory results in the field of high dc resistance.


► Electrical Metrological Laboratories are traceable to INRIM in different ways.
► Calibrators and DMM can be involved in measurement systems of high resistance.
► Inter-laboratories comparisons are made to verify measures compatibility.
► A comparison of high resistance among eight Labs and INRIM gave with good results.
► The different methods of traceability transfer lead to correct results for high resistance.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Measurement - Volume 45, Issue 3, April 2012, Pages 615–621
نویسندگان
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