An oscillation-based built-in test scheme with AGC loop

The paper validates Oscillation-Based Built-In Test (OBIT) scheme for testing the analog portion of mixed-signal system assembled on a printed circuit board. This scheme uses both frequency and time domain measurements in order to maximize the fault coverage. Some aspects of implementation of the OBIT that comprises transformation of the circuit under test to an oscillator and designing of a measuring system, is presented. Special attention is being paid to the development and analysis of the oscillation-based test structure with an automatic gain control (AGC) loop.