Laser probing of anisotropic ultrathin dielectric films on absorbing materials via differential reflection characteristics

The reflection from an ultrathin anisotropic film on an isotropic absorbing substrate is investigated in the long-wavelength limit. The analytical expressions for the differential reflection characteristics of s- and p-polarized electromagnetic plane waves are obtained. All analytical results are correlated with the numerical solution of the reflection problem on the basis of rigorous electromagnetic theory for anisotropic medium. The possibilities of using the obtained approximate formulas for resolving the inverse problem for ultrathin anisotropic dielectric films upon absorbing substrates are discussed.