کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
736809 893892 2009 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Determining the Young's modulus and creep effects in three different photo definable epoxies for MEMS applications
موضوعات مرتبط
مهندسی و علوم پایه شیمی الکتروشیمی
پیش نمایش صفحه اول مقاله
Determining the Young's modulus and creep effects in three different photo definable epoxies for MEMS applications
چکیده انگلیسی

In this study, a fundamental measurement of the Young's modulus of Epoclad and Epocore negative photo resist is performed, using a miniature tensile test setup. The experiments were done on miniature dog bone tensile test structures which are fabricated using normal micro machining methods. In addition, the creep behavior and the maximum stress and strain at the point of fracture of the resists is recorded. The two resists reveal a mechanical behavior very similar to the well-reported resist SU-8. SU-8 is also tested using the same tools for comparison.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators A: Physical - Volume 156, Issue 1, November 2009, Pages 196–200
نویسندگان
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