کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
746387 | 894452 | 2009 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Super-resolution digital speckle photography for micro/nano measurements
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موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
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چکیده انگلیسی
Speckle photography, also referred to as one-beam speckle interferometry, has gone through several evolutions. It started as laser speckle photography and then white light speckle photography and recently the electron speckle photography. With the advent of CCD and computational power of PC, the process of recording also changed from optical (i.e., photographic) to digital. This paper presents some recent development of super-resolution digital speckle photography with the emphasis on micro/nano measurements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 47, Issue 2, February 2009, Pages 274–279
Journal: Optics and Lasers in Engineering - Volume 47, Issue 2, February 2009, Pages 274–279
نویسندگان
Fu-Pen Chiang,