The SIFT and FALP techniques; applications to ionic and electronic reactions studies and their evolution to the SIFT-MS and FA-MS analytical methods

The SIFT and FALP techniques; applications to ionic and electronic reactions studies and their evolution to the SIFT-MS and FA-MS analytical methods

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Mass Spectrometry - Volume 377, 1 February 2015, Pages 467-478

David Smith, Patrik Španěl,