کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7642115 1494870 2016 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Identification of forgeries in historical enamels by combining the non-destructive scanning XRF imaging and alpha-PIXE portable techniques
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
Identification of forgeries in historical enamels by combining the non-destructive scanning XRF imaging and alpha-PIXE portable techniques
چکیده انگلیسی
The high concentration values of Pb in the glass matrix as well as the extensive use of chemical components based on Cr, Zn, and As, questioned the authenticity of the three artworks and postponed their manufacturing dating from the XVIII century AD. The application of a matrix factorization analysis to the XRF data allowed highlighting the chemical associations among Cd, Se, Ba and Zn, indicating the use of a modern cadmium lithopone in the red decorations. The analytical results obtained during the investigation suggest a classification of the three objects as modern copies.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microchemical Journal - Volume 124, January 2016, Pages 241-246
نویسندگان
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