Scanning Kelvin Probe Microscopy investigation of the contact resistances and charge mobility in n-type PDIF-CN2 thin-film transistors

Scanning Kelvin Probe Microscopy investigation of the contact resistances and charge mobility in n-type PDIF-CN2 thin-film transistors

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Organic Electronics - Volume 52, January 2018, Pages 206-212

Federico Chianese, Fabio Chiarella, Mario Barra, Antonio Carella, Antonio Cassinese,