ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization

ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 458, 15 November 2018, Pages 805-809

Chang Min Choi, Sang Ju Lee, Ji Young Baek, Jeong Jin Kim, Myoung Choul Choi,