A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials

A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 433, 1 March 2018, Pages 994-1017

Shiladitya Chatterjee, Bhupinder Singh, Anubhav Diwan, Zheng Rong Lee, Mark H. Engelhard, Jeff Terry, H. Dennis Tolley, Neal B. Gallagher, Matthew R. Linford,