AFM characterization of patterned sapphire substrate with dense cone arrays: Image artifacts and tip-cone convolution effect

AFM characterization of patterned sapphire substrate with dense cone arrays: Image artifacts and tip-cone convolution effect

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 433, 1 March 2018, Pages 358-366

Jian Shen, Dan Zhang, Fei-Hu Zhang, Yang Gan,