کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7845468 | 1508465 | 2009 | 22 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ballistic electron microscopy and spectroscopy of metal and semiconductor nanostructures
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Ballistic electron emission microscopy (BEEM) and its spectroscopy utilize ballistic transport of hot carriers as a versatile tool to characterize nanometer-scale structural and electronic properties of metallic and semiconducting materials and their interfaces. In this review, recent progress in experimental and theoretical aspects of the BEEM technique are covered. Emphasis is drawn to the development of BEEM in several emerging fields, including spin-sensitive hot-carrier transport through ferromagnetic thin films and multilayers, hot-electron spectroscopy and imaging of organic thin films and molecules, and hot-electron induced electroluminescence in semiconductor heterostructures. A brief discussion on BEEM of cross-sectional semiconductor heterostructures and advanced insulator films is also included.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science Reports - Volume 64, Issue 5, 1 May 2009, Pages 169-190
Journal: Surface Science Reports - Volume 64, Issue 5, 1 May 2009, Pages 169-190
نویسندگان
W. Yi, A.J. Stollenwerk, V. Narayanamurti,