کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7906085 1510751 2018 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Tellurite suboxide based near-infrared reflector and filter
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Tellurite suboxide based near-infrared reflector and filter
چکیده انگلیسی
TeO1.4/SiO2 one-dimensional photonic crystals (1D PCs) were prepared using radio frequency (RF) magnetron sputtering to fabricate a reflector and a filter with photonic band gaps (PBGs) in the near infrared (NIR) region. Stoichiometry and phase state of the TeOx thin film were characterized via X-ray photoelectron spectroscopy (XPS) and X-Ray Diffraction (XRD), respectively. The microstructural and optical characteristics of the 1D PCs were evaluated using scanning electron microscopy (SEM), atomic force microscopy (AFM) and ultraviolet visible near-infrared spectrophotometer (UV-VIS-NIR). The experimental reflectance spectra were consistent with the theoretical results simulated using the transfer matrix method (TMM). For the reflector, a PBG of 1273-1676 nm (Δλ = 403 nm) was achieved in the NIR region. For the filter, the introduction of a defect layer in the 1D PC led to a resonant peak at the central wavelength of 1461 nm within the PBG of 1250-1733 nm (Δλ = 483 nm). The effects of the structural parameters, including the incident angle, the state of polarization and the thickness of the defect layer, were also theoretically analyzed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optical Materials - Volume 83, September 2018, Pages 157-164
نویسندگان
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