Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 153, August 2018, Pages 109-113

Georges Beainy, Reynald Alcotte, Franck Bassani, Mickaël Martin, Adeline Grenier, Thierry Baron, Jean-Paul Barnes,