In-situ observation of radiation damage in nano-structured amorphous SiOC/crystalline Fe composite

(a) Schematic illustration of in-situ irradiation. The typical cross-sectional bright-field TEM micrographs of thin Fe/SiOC multilayer films after (b) 50 K and (c) 573 K irradiations with a dose of 1 × 1015 ions/cm2. Results clearly show that intermixing between Fe and SiOC is most severe for irradiation at 50 K and a demixing process is observed for thin multilayer sample after irradiations at 573 K. The cross-sectional bright-field TEM images of thick Fe/SiOC multilayer films after (d) 50 K and (e) 573 K irradiations (a dose of 1 × 1015 ions/cm2). The results show a formation of intermixed layer after 50 K irradiation but no observed change after 573 K irradiation in thick Fe/SiOC multilayer sample.206