Precise strain profile measurement as a function of depth in thermal barrier coatings using high energy synchrotron X-rays

Precise strain profile measurement as a function of depth in thermal barrier coatings using high energy synchrotron X-rays

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 113, 1 March 2016, Pages 122-126

C. Li, S.D.M. Jacques, Y. Chen, P. Xiao, A.M. Beale, M. di Michiel, N. Markossan, P. Nylen, R.J. Cernik,